JPS6056285U - 半導体ｉｃ試験装置 - Google Patents

半導体ｉｃ試験装置

Info

Publication number
JPS6056285U
JPS6056285U JP14946483U JP14946483U JPS6056285U JP S6056285 U JPS6056285 U JP S6056285U JP 14946483 U JP14946483 U JP 14946483U JP 14946483 U JP14946483 U JP 14946483U JP S6056285 U JPS6056285 U JP S6056285U
Authority
JP
Japan
Prior art keywords
guide part
holding
semiconductor
terminals
package
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14946483U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0421105Y2 (en]
Inventor
原口　明久
立石　勝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP14946483U priority Critical patent/JPS6056285U/ja
Publication of JPS6056285U publication Critical patent/JPS6056285U/ja
Application granted granted Critical
Publication of JPH0421105Y2 publication Critical patent/JPH0421105Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP14946483U 1983-09-27 1983-09-27 半導体ｉｃ試験装置 Granted JPS6056285U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14946483U JPS6056285U (ja) 1983-09-27 1983-09-27 半導体ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14946483U JPS6056285U (ja) 1983-09-27 1983-09-27 半導体ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPS6056285U true JPS6056285U (ja) 1985-04-19
JPH0421105Y2 JPH0421105Y2 (en]) 1992-05-14

Family

ID=30331781

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14946483U Granted JPS6056285U (ja) 1983-09-27 1983-09-27 半導体ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JPS6056285U (en])

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02250282A (ja) * 1989-03-22 1990-10-08 Yamaichi Electric Mfg Co Ltd Ｉｃソケット
JP2007248181A (ja) * 2006-03-15 2007-09-27 Onishi Denshi Kk 半導体デバイス用検査ソケット

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6034031A (ja) * 1983-08-05 1985-02-21 Tokyo Seimitsu Co Ltd 半導体素子の測定装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6034031A (ja) * 1983-08-05 1985-02-21 Tokyo Seimitsu Co Ltd 半導体素子の測定装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02250282A (ja) * 1989-03-22 1990-10-08 Yamaichi Electric Mfg Co Ltd Ｉｃソケット
JP2007248181A (ja) * 2006-03-15 2007-09-27 Onishi Denshi Kk 半導体デバイス用検査ソケット

Also Published As

Publication number Publication date
JPH0421105Y2 (en]) 1992-05-14

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